Dielectric Relaxation Properties of Ba_1-xBi_x(Ti_0.9Zr_0.1)O₃ Ceramics

Ba_1-xBi_x(Ti_0.9Zr_0.1)O₃(x=0.01, 0.02, 0.03, 0.04) ceramics is prepared by a conventional ceramics preparation technique. X-ray diffraction analysis indicates that all of the ceramics samples are tetragonal crystal structure, and 3% mol of Bi³⁺ doping can be fully incorporated into the perovskite lattice. The dielectric constants as a function of temperature at different frequencies show that all of the ceramics have characteristics of ferroelectrics with diffused phase transition, and the ceramics sample of x ≥ 0.02 exhibits typical relaxor ferroelectric characteristic. The relaxor characteristics are discussed according to polar nano-microregion and domain wall.